AGM-620 is a high-performance Energy Dispersive X-Ray Fluorescence (EDXRF) analyzer designed for fast, precise, and completely non-destructive testing of precious metals. Engineered with advanced Fast Silicon Drift Detector (FSDD) technology, it delivers instant and accurate analysis of gold purity, elemental composition, and alloy identification without damaging the sample.
Ideal for jewelers, hallmarking centers, refiners, and precious metal laboratories, the AGM-620 combines cutting-edge XRF technology with user-friendly software, providing reliable results with a single button operation. Its spacious sample chamber, live high-resolution camera, and comprehensive reporting features make it an efficient solution for professional precious metal analysis.
Key Features
Fast and accurate non-destructive gold and precious metal analysis
Advanced Fast Silicon Drift Detector (FSDD) for high-precision measurement
Instant karat and elemental composition analysis
Gold purity accuracy up to 0.1%
Single-touch operation with intuitive software
High-resolution live camera for precise sample positioning
Large sample chamber (160 150 90 mm) supporting samples up to 15 kg
Detects more than 25 elements using Fundamental Parameter (FP) method
BIS Hallmarking report compatibility
Expandable database with image-supported customized reports
Safety interlock system ensures X-ray operation only when the chamber door is closed
Applications
Jewelry manufacturing and quality control
Gold and precious metal testing
BIS hallmarking and karat certification
Refining and melting operations
Coin and alloy analysis
Museums and archaeological laboratories
Precious metal trading and assaying